Figure 3

Maps of area A shown in Fig. 2c. a) Cumulative misorientation map derived from EBSD data showing disorientation relative to reference orientation shown by a cross. Boundaries between adjacent pixels with disorientation angles of >0.5°, >1°, and >2° are shown as solid lines. Misorientation axes for boundaries (i) to (iv) are shown in Fig. 5. (v) Stereographic projection of poles to low index crystallographic planes for all pixels indexed as zircon in shown in (a). b) Local misorientation map derived from EBSD data. Each pixel is coloured according to the mean disorientation value from a surrounding 5 × 5 pixel grid. Misorientations that define coarse vertical grid lines in (a) and (b) are an artefact of data collection (see text), and were disregarded for misorientation analysis. The position of SHRIMP analyses are indicated on each map. Profile along line x-x' is shown in Fig. 6. c) Panchromatic cathodoluminescence (CL) image. The locations of SHRIMP analyses are shown. Pale linear features are scratches in the C-coat.