Enhanced diffusion of Uranium and Thorium linked to crystal plasticity in zircon

Table 1 SEM Settings, EBSD and λCL collection and processing variables.

SEM Settings	EBSD	Panchromatic CL	λCL
SEM	Philips XL30	Philips XL30	Jeol JXA8200
Detector	Nordlys 1	CCD-Si (K.E. Developments Ltd)	2049-element linear spectrometer/CCD-Si
Analytical/acquisition system	HKL Channel 5	Philips	XCLent (CSIRO)
C coat	Y	Y	Y
Working distance (mm)	20	15	11
Tilt (°)	70	0	0
Accelerating voltage (kV)	20	10	20
Spot size (μm)	~0.5(#5)	~0.5(#7)	2
Probe current (nA)	N.M.	N.M.	100 nA
EBSD Settings		λCL settings
EBSP collection time per frame (ms)	60	Sensitivity (nphotons/count)	86
Background (frames)	64	Spectral range (nm)	331.4 to 1826.9
EBSP noise reduction (frames/binning)	4/4 × 4	Dwell time per point (ms)	50
Step size (μm)	5	Grating (lines/mm)	300
*Indexing settings*		Blaze width (nm)	500
Reflector file	Card 5260*	Step size (μm)	2
Band detection (n bands)	8	Grid	250 × 250
Hough resolution	60
Average mean angular deviation (°)	0.3223
*Noise reduction*
Wildspike (% of total data)	0.0002
6 neighbor zero solution extrapolation (% of total data)	0.85
Orientation averaging filter** (Filter size/smoothing angle/artifact angle)	3 × 3/5°/1°

N.M. = not measured. * = generated from Card No 5260 of the Mincryst crystallographic and crystallochemical database [38]. ** = detailed in Humphreys et al. [39]

ISSN: 1467-4866